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Dielectric Capacitance – Voltage Response as a Predictor of Voltage‐Controlled Magnetic Anisotropy Efficiency.

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Title: Dielectric Capacitance – Voltage Response as a Predictor of Voltage‐Controlled Magnetic Anisotropy Efficiency.
Authors: Yun, Ji‐Hyeon1,2, Sim, Kyumin3, Park, Yeon‐Su4, Hwang, In‐Kook1, Lim, Sang Ho2, Park, Byong‐Guk4, bgpark@kaist.ac.kr, Park, Hamin3, parkhamin@kw.ac.kr, Baek, Seung‐heon Chris1, seungheon.baek@kist.re.kr
Source: Advanced Materials Interfaces; 1/20/2026, Vol. 13 Issue 2, p1-8, 8p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 190987476
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Dielectric Capacitance – Voltage Response as a Predictor of Voltage‐Controlled Magnetic Anisotropy Efficiency.
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Materials+Interfaces%22">Advanced Materials Interfaces</searchLink>; 1/20/2026, Vol. 13 Issue 2, p1-8, 8p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=190987476
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      – Type: doi
        Value: 10.1002/admi.202500810
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      – Code: eng
        Text: English
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        PageCount: 8
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      – TitleFull: Dielectric Capacitance – Voltage Response as a Predictor of Voltage‐Controlled Magnetic Anisotropy Efficiency.
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            NameFull: Lim, Sang Ho
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              M: 01
              Text: 1/20/2026
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              Y: 2026
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