Quantitative Models for the Effects of Differential-pressure Manometer Scale Resolution and Hot-wire Voltage Measurement Bit Depth on Gaussian Fluctuation Characteristics.
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| Title: | Quantitative Models for the Effects of Differential-pressure Manometer Scale Resolution and Hot-wire Voltage Measurement Bit Depth on Gaussian Fluctuation Characteristics. |
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| Authors: | Fukuhara, H.1, Suzuki, H.1, h.suzuki@okayama-u.ac.jp, Kouchi, T.1 |
| Source: | Journal of Applied Fluid Mechanics; Feb2026, Vol. 19 Issue 2, p1-11, 11p |
| Database: | Applied Science & Technology Source |
| FullText | Links: – Type: pdflink Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 191030692 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Quantitative Models for the Effects of Differential-pressure Manometer Scale Resolution and Hot-wire Voltage Measurement Bit Depth on Gaussian Fluctuation Characteristics. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Fukuhara%2C+H%2E%22">Fukuhara, H.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Suzuki%2C+H%2E%22">Suzuki, H.</searchLink><relatesTo>1</relatesTo>, <i>h.suzuki@okayama-u.ac.jp</i><br /><searchLink fieldCode="AU" term="%22Kouchi%2C+T%2E%22">Kouchi, T.</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Applied+Fluid+Mechanics%22">Journal of Applied Fluid Mechanics</searchLink>; Feb2026, Vol. 19 Issue 2, p1-11, 11p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=191030692 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.47176/jafm.19.2.3817 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 11 StartPage: 1 Titles: – TitleFull: Quantitative Models for the Effects of Differential-pressure Manometer Scale Resolution and Hot-wire Voltage Measurement Bit Depth on Gaussian Fluctuation Characteristics. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Fukuhara, H. – PersonEntity: Name: NameFull: Suzuki, H. – PersonEntity: Name: NameFull: Kouchi, T. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 02 Text: Feb2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 17353572 Numbering: – Type: volume Value: 19 – Type: issue Value: 2 Titles: – TitleFull: Journal of Applied Fluid Mechanics Type: main |
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