Sieg-Letessier, T., Vivo, A., Perrin, F., Marque, J., Ferrari, M., & Barrett, R. (2026). Long trace profiler downward- and sideways-facing measurement simulations. Review of Scientific Instruments, 97(1), 1. https://doi.org/10.1063/5.0291270
Chicago Style (17th ed.) CitationSieg-Letessier, T., A. Vivo, F. Perrin, J. Marque, M. Ferrari, and R. Barrett. "Long Trace Profiler Downward- and Sideways-facing Measurement Simulations." Review of Scientific Instruments 97, no. 1 (2026): 1. https://doi.org/10.1063/5.0291270.
MLA (9th ed.) CitationSieg-Letessier, T., et al. "Long Trace Profiler Downward- and Sideways-facing Measurement Simulations." Review of Scientific Instruments, vol. 97, no. 1, 2026, p. 1, https://doi.org/10.1063/5.0291270.
Warning: These citations may not always be 100% accurate.
