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Long trace profiler downward- and sideways-facing measurement simulations.

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Title: Long trace profiler downward- and sideways-facing measurement simulations.
Authors: Sieg-Letessier, T.1,2, theo.sieg-letessier@esrf.fr, Vivo, A.2, Perrin, F.2, Marque, J.3, Ferrari, M.1, Barrett, R.2
Source: Review of Scientific Instruments; Jan2026, Vol. 97 Issue 1, p1-6, 6p
Database: Applied Science & Technology Source
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  Availability: 0
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DbLabel: Applied Science & Technology Source
An: 191264554
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; Jan2026, Vol. 97 Issue 1, p1-6, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=191264554
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      – Type: doi
        Value: 10.1063/5.0291270
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      – Code: eng
        Text: English
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        PageCount: 6
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      – TitleFull: Long trace profiler downward- and sideways-facing measurement simulations.
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              Text: Jan2026
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              Y: 2026
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