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Impact of AlN buffer thickness on electrical and thermal characteristics of AlGaN/GaN/AlN HEMTs.

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Title: Impact of AlN buffer thickness on electrical and thermal characteristics of AlGaN/GaN/AlN HEMTs.
Authors: Kim, Minho1,2, minho.kim@liu.se, Tran, Dat Q.1,3, Paskov, Plamen P.1, Choi, Uiho4, Nam, Okhyun5, Darakchieva, Vanya1,2,6, minho.kim@liu.se
Source: Applied Physics Letters; 1/26/2026, Vol. 128 Issue 4, p1-6, 6p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 191264622
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Impact of AlN buffer thickness on electrical and thermal characteristics of AlGaN/GaN/AlN HEMTs.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Kim%2C+Minho%22">Kim, Minho</searchLink><relatesTo>1,2</relatesTo>, <i>minho.kim@liu.se</i><br /><searchLink fieldCode="AU" term="%22Tran%2C+Dat+Q%2E%22">Tran, Dat Q.</searchLink><relatesTo>1,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Paskov%2C+Plamen+P%2E%22">Paskov, Plamen P.</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Choi%2C+Uiho%22">Choi, Uiho</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Nam%2C+Okhyun%22">Nam, Okhyun</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Darakchieva%2C+Vanya%22">Darakchieva, Vanya</searchLink><relatesTo>1,2,6</relatesTo>, <i>minho.kim@liu.se</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Physics+Letters%22">Applied Physics Letters</searchLink>; 1/26/2026, Vol. 128 Issue 4, p1-6, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=191264622
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1063/5.0310464
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 1
    Titles:
      – TitleFull: Impact of AlN buffer thickness on electrical and thermal characteristics of AlGaN/GaN/AlN HEMTs.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Kim, Minho
      – PersonEntity:
          Name:
            NameFull: Tran, Dat Q.
      – PersonEntity:
          Name:
            NameFull: Paskov, Plamen P.
      – PersonEntity:
          Name:
            NameFull: Choi, Uiho
      – PersonEntity:
          Name:
            NameFull: Nam, Okhyun
      – PersonEntity:
          Name:
            NameFull: Darakchieva, Vanya
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 26
              M: 01
              Text: 1/26/2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 00036951
          Numbering:
            – Type: volume
              Value: 128
            – Type: issue
              Value: 4
          Titles:
            – TitleFull: Applied Physics Letters
              Type: main
ResultId 1