Influence of CuO thin film morphology on secondary electron emission: implications for the electron cloud phenomenon in high energy accelerators.
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| Title: | Influence of CuO thin film morphology on secondary electron emission: implications for the electron cloud phenomenon in high energy accelerators. |
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| Authors: | Sattonnay, G1, gael.sattonnay@ijclab.in2p3.fr, Prud'homme, N2, Yemane, J1, Bilgen, S1, Racic, C2, Mohammad, M1 |
| Source: | Journal of Physics D: Applied Physics; 2026, Vol. 59 Issue 9, p1-13, 13p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 192160253 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192160253 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1088/1361-6463/ae4994 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 13 StartPage: 1 Titles: – TitleFull: Influence of CuO thin film morphology on secondary electron emission: implications for the electron cloud phenomenon in high energy accelerators. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sattonnay, G – PersonEntity: Name: NameFull: Prud'homme, N – PersonEntity: Name: NameFull: Yemane, J – PersonEntity: Name: NameFull: Bilgen, S – PersonEntity: Name: NameFull: Racic, C – PersonEntity: Name: NameFull: Mohammad, M IsPartOfRelationships: – BibEntity: Dates: – D: 06 M: 03 Text: 2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 00223727 Numbering: – Type: volume Value: 59 – Type: issue Value: 9 Titles: – TitleFull: Journal of Physics D: Applied Physics Type: main |
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