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Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model.

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Title: Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model.
Authors: Beddiaf, Abdelaziz1,2, beddiafaziz@univ-khenchela.dz, Medjaldi, Malika1, malika.medjaldi@univ-khenchela.dz, Djamai, Djemouai3, djamai_djmouai@univ-khenchela.dz, Lanani, Abderrahim1, lanani_arahim@univ-khenchela.dz
Source: Electronics & Electrical Engineering; 2025, Vol. 31 Issue 5, p35-40, 6p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 192367773
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Beddiaf%2C+Abdelaziz%22">Beddiaf, Abdelaziz</searchLink><relatesTo>1,2</relatesTo>, <i>beddiafaziz@univ-khenchela.dz</i><br /><searchLink fieldCode="AU" term="%22Medjaldi%2C+Malika%22">Medjaldi, Malika</searchLink><relatesTo>1</relatesTo>, <i>malika.medjaldi@univ-khenchela.dz</i><br /><searchLink fieldCode="AU" term="%22Djamai%2C+Djemouai%22">Djamai, Djemouai</searchLink><relatesTo>3</relatesTo>, <i>djamai_djmouai@univ-khenchela.dz</i><br /><searchLink fieldCode="AU" term="%22Lanani%2C+Abderrahim%22">Lanani, Abderrahim</searchLink><relatesTo>1</relatesTo>, <i>lanani_arahim@univ-khenchela.dz</i>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Electronics+%26+Electrical+Engineering%22">Electronics & Electrical Engineering</searchLink>; 2025, Vol. 31 Issue 5, p35-40, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=192367773
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.5755/j02.eie.39263
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 6
        StartPage: 35
    Titles:
      – TitleFull: Optical Characterization of Silicon Nitride-based Bilayer Thin Films Using Spectroscopic Ellipsometry and the Maxwell-Garnett Model.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Beddiaf, Abdelaziz
      – PersonEntity:
          Name:
            NameFull: Medjaldi, Malika
      – PersonEntity:
          Name:
            NameFull: Djamai, Djemouai
      – PersonEntity:
          Name:
            NameFull: Lanani, Abderrahim
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 09
              Text: 2025
              Type: published
              Y: 2025
          Identifiers:
            – Type: issn-print
              Value: 13921215
          Numbering:
            – Type: volume
              Value: 31
            – Type: issue
              Value: 5
          Titles:
            – TitleFull: Electronics & Electrical Engineering
              Type: main
ResultId 1