Gao, H., Jin, J., & Zhou, J. (2026). A Measurement‐Based 1‐ to 100‐GHz Lumped Model for On‐Chip Transformers With 3.2% Average Error. International Journal of Circuit Theory & Applications, 54(4), 2364. https://doi.org/10.1002/cta.70132
Chicago Style (17th ed.) CitationGao, Hanqi, Jing Jin, and Jianjun Zhou. "A Measurement‐Based 1‐ to 100‐GHz Lumped Model for On‐Chip Transformers With 3.2% Average Error." International Journal of Circuit Theory & Applications 54, no. 4 (2026): 2364. https://doi.org/10.1002/cta.70132.
MLA (9th ed.) CitationGao, Hanqi, et al. "A Measurement‐Based 1‐ to 100‐GHz Lumped Model for On‐Chip Transformers With 3.2% Average Error." International Journal of Circuit Theory & Applications, vol. 54, no. 4, 2026, p. 2364, https://doi.org/10.1002/cta.70132.