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Synchrotron-based depth-resolved residual stress evaluation with adjustable double slits: End-to-end simulations.

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Title: Synchrotron-based depth-resolved residual stress evaluation with adjustable double slits: End-to-end simulations.
Authors: Wu, H.1, Du, J.2, Cai, Y.1,3, Fan, D.1, Luo, C.4, Tang, M.X.5, Fang, X.1, Yang, K.6, Deng, Y.J.1, yjdeng@pims.ac.cn, Pan, R.C.1, Lu, L.1,3,4, llu@swjtu.edu.cn, Luo, S.N.4
Source: NDT & E International; Jun2026, Vol. 161, pN.PAG-N.PAG, 1p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 192842286
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PubType: Academic Journal
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RecordInfo BibRecord:
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        Value: 10.1016/j.ndteint.2026.103718
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              Text: Jun2026
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