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Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.

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Title: Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.
Authors: Lu, Kuan1, Lin, Pengfei1, Cho, Hyeonho2, Kim, Sunghan2, Park, Jiyong3,4, Lee, ChaBum1, cblee@tamu.edu
Source: Review of Scientific Instruments; Apr2026, Vol. 97 Issue 4, p1-10, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 193402239
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.
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  Data: <searchLink fieldCode="JN" term="%22Review+of+Scientific+Instruments%22">Review of Scientific Instruments</searchLink>; Apr2026, Vol. 97 Issue 4, p1-10, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193402239
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1063/5.0309841
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      – Code: eng
        Text: English
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        PageCount: 10
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      – TitleFull: Atomic force microscopy (AFM) tip metrology and inspection by knife edge diffractometry.
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            NameFull: Lu, Kuan
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            NameFull: Lin, Pengfei
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            – D: 01
              M: 04
              Text: Apr2026
              Type: published
              Y: 2026
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