X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis. - Jiang, Yumeng; Zhang, Zhenwei; An, Zhongyi; Pan, Xinyu; Shi, Xinmin; Wang, Ruonan; Li, Jiajian; Chen, Chengzhi; Cao, Zhiqiang; Xu, Yong; Wei, Jiaqi; Zhang, Xueying; et al. (Crystals (2073-4352), 2026)