Bias Dependence of Single-Trap Low-Frequency Noise in Junctionless Nanowire Transistors.

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Bibliographic Details
Title: Bias Dependence of Single-Trap Low-Frequency Noise in Junctionless Nanowire Transistors.
Authors: Silva, Everton M.1, evertonsilva@fei.edu.br, Trevisoli, Renan2, Doria, Rodrigo T.1,2
Source: Journal of Integrated Circuits & Systems; 2026, Vol. 21 Issue 1, p1-6, 6p
Database: Applied Science & Technology Source
Description
ISSN:18071953
DOI:10.29292/jics.v21i1.1163