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Bias Dependence of Single-Trap Low-Frequency Noise in Junctionless Nanowire Transistors.

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Title: Bias Dependence of Single-Trap Low-Frequency Noise in Junctionless Nanowire Transistors.
Authors: Silva, Everton M.1, evertonsilva@fei.edu.br, Trevisoli, Renan2, Doria, Rodrigo T.1,2
Source: Journal of Integrated Circuits & Systems; 2026, Vol. 21 Issue 1, p1-6, 6p
Database: Applied Science & Technology Source
FullText Text:
  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 193600700
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Bias Dependence of Single-Trap Low-Frequency Noise in Junctionless Nanowire Transistors.
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  Data: <searchLink fieldCode="AU" term="%22Silva%2C+Everton+M%2E%22">Silva, Everton M.</searchLink><relatesTo>1</relatesTo>, <i>evertonsilva@fei.edu.br</i><br /><searchLink fieldCode="AU" term="%22Trevisoli%2C+Renan%22">Trevisoli, Renan</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Doria%2C+Rodrigo+T%2E%22">Doria, Rodrigo T.</searchLink><relatesTo>1,2</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Journal+of+Integrated+Circuits+%26+Systems%22">Journal of Integrated Circuits & Systems</searchLink>; 2026, Vol. 21 Issue 1, p1-6, 6p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193600700
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.29292/jics.v21i1.1163
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      – Code: eng
        Text: English
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        PageCount: 6
        StartPage: 1
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      – TitleFull: Bias Dependence of Single-Trap Low-Frequency Noise in Junctionless Nanowire Transistors.
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            NameFull: Silva, Everton M.
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            NameFull: Trevisoli, Renan
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            NameFull: Doria, Rodrigo T.
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              Text: 2026
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              Y: 2026
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              Value: 21
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