APA (7th ed.) Citation

Brown, H., Kirkland, O., & Tyagi, P. (2026). Electron Spin Resonance Gauging the Effect of Temperature on Magnetic Tunnel Junctions and its Constituents Thin-films. Journal of Electronic Materials, 55(6), 5041. https://doi.org/10.1007/s11664-026-12841-x

Chicago Style (17th ed.) Citation

Brown, Hayden, Omari Kirkland, and Pawan Tyagi. "Electron Spin Resonance Gauging the Effect of Temperature on Magnetic Tunnel Junctions and Its Constituents Thin-films." Journal of Electronic Materials 55, no. 6 (2026): 5041. https://doi.org/10.1007/s11664-026-12841-x.

MLA (9th ed.) Citation

Brown, Hayden, et al. "Electron Spin Resonance Gauging the Effect of Temperature on Magnetic Tunnel Junctions and Its Constituents Thin-films." Journal of Electronic Materials, vol. 55, no. 6, 2026, p. 5041, https://doi.org/10.1007/s11664-026-12841-x.