Novel Asymmetric CCRP Die Geometry for Optimized Microstructure and Outstanding Failure Tolerance.

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Bibliographic Details
Title: Novel Asymmetric CCRP Die Geometry for Optimized Microstructure and Outstanding Failure Tolerance.
Authors: Tripathi, Nikhil1,2, ntripath@cityu.edu.hk, Setia, Prince2,3,4, prince.setia@umanitoba.ca, Sawalkar, Swapnil5, Mondal, K.2,3, kallol@iitk.ac.in, Shekhar, Shashank2, shashank@iitk.ac.in
Source: Journal of Materials Engineering & Performance; May2026, Vol. 35 Issue 18, p18384-18402, 19p
Database: Applied Science & Technology Source
Description
ISSN:10599495
DOI:10.1007/s11665-025-12942-4