Bibliographic Details
| Title: |
Study on the imaging of bright-field and dark-field for contact holes in extreme ultraviolet lithography considering stage vibration effects. |
| Authors: |
Shen, Hao1,2,3, Zhang, Libin1,2,3, zhanglibin@ime.ac.cn, Wang, Jiashuo1,2,3, Rui, Dinghai1,2,3, Su, Yajuan1,2,3, Wei, Yayi1,2,3, zhanglibin@ime.ac.cn |
| Source: |
Journal of Vacuum Science & Technology: Part B-Nanotechnology & Microelectronics; May2026, Vol. 44 Issue 3, p1-10, 10p |
| Database: |
Applied Science & Technology Source |