APA (7th ed.) Citation

Sun, Z., Chen, J., Lin, C., Yue, X., Wang, K., & Meng, L. (2026). YOLO-CF: An Object Detection Model that Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection. Journal of Advanced Computational Intelligence & Intelligent Informatics, 30(3), 825. https://doi.org/10.20965/jaciii.2026.p0825

Chicago Style (17th ed.) Citation

Sun, Zhaowei, Jintao Chen, Cong Lin, Xuebin Yue, Kuozhan Wang, and Lin Meng. "YOLO-CF: An Object Detection Model That Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection." Journal of Advanced Computational Intelligence & Intelligent Informatics 30, no. 3 (2026): 825. https://doi.org/10.20965/jaciii.2026.p0825.

MLA (9th ed.) Citation

Sun, Zhaowei, et al. "YOLO-CF: An Object Detection Model That Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection." Journal of Advanced Computational Intelligence & Intelligent Informatics, vol. 30, no. 3, 2026, p. 825, https://doi.org/10.20965/jaciii.2026.p0825.