YOLO-CF: An Object Detection Model that Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection.
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| Title: | YOLO-CF: An Object Detection Model that Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection. |
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| Authors: | Sun, Zhaowei1, hdzhaoweisun@163.com, Chen, Jintao2, Lin, Cong3, menglin@fc.ritsumei.ac.jp, Yue, Xuebin4, yuexuebin@zut.edu.cn, Wang, Kuozhan4, Meng, Lin5 |
| Source: | Journal of Advanced Computational Intelligence & Intelligent Informatics; May2026, Vol. 30 Issue 3, p825-838, 14p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 193865269 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: YOLO-CF: An Object Detection Model that Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Sun%2C+Zhaowei%22">Sun, Zhaowei</searchLink><relatesTo>1</relatesTo>, <i>hdzhaoweisun@163.com</i><br /><searchLink fieldCode="AU" term="%22Chen%2C+Jintao%22">Chen, Jintao</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lin%2C+Cong%22">Lin, Cong</searchLink><relatesTo>3</relatesTo>, <i>menglin@fc.ritsumei.ac.jp</i><br /><searchLink fieldCode="AU" term="%22Yue%2C+Xuebin%22">Yue, Xuebin</searchLink><relatesTo>4</relatesTo>, <i>yuexuebin@zut.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Kuozhan%22">Wang, Kuozhan</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Meng%2C+Lin%22">Meng, Lin</searchLink><relatesTo>5</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Advanced+Computational+Intelligence+%26+Intelligent+Informatics%22">Journal of Advanced Computational Intelligence & Intelligent Informatics</searchLink>; May2026, Vol. 30 Issue 3, p825-838, 14p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=193865269 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.20965/jaciii.2026.p0825 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 14 StartPage: 825 Titles: – TitleFull: YOLO-CF: An Object Detection Model that Improves Feature Expression at Both Coarse-Grained and Fine-Grained Levels for Industrial Surface Image Defect Detection. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Sun, Zhaowei – PersonEntity: Name: NameFull: Chen, Jintao – PersonEntity: Name: NameFull: Lin, Cong – PersonEntity: Name: NameFull: Yue, Xuebin – PersonEntity: Name: NameFull: Wang, Kuozhan – PersonEntity: Name: NameFull: Meng, Lin IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 05 Text: May2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 13430130 Numbering: – Type: volume Value: 30 – Type: issue Value: 3 Titles: – TitleFull: Journal of Advanced Computational Intelligence & Intelligent Informatics Type: main |
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