APA (7th ed.) Citation

Li, J., Hu, E., Wei, W., & Shi, F. (2026). From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing. Advanced Functional Materials, 36(41), 1. https://doi.org/10.1002/adfm.202528142

Chicago Style (17th ed.) Citation

Li, Jianyu, Ertao Hu, Wei Wei, and Feifei Shi. "From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing." Advanced Functional Materials 36, no. 41 (2026): 1. https://doi.org/10.1002/adfm.202528142.

MLA (9th ed.) Citation

Li, Jianyu, et al. "From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing." Advanced Functional Materials, vol. 36, no. 41, 2026, p. 1, https://doi.org/10.1002/adfm.202528142.