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From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.

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Title: From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.
Authors: Li, Jianyu1, Hu, Ertao2, Wei, Wei2, Shi, Feifei1,3, feifeishi@psu.edu
Source: Advanced Functional Materials; May2026, Vol. 36 Issue 41, p1-22, 22p
Database: Applied Science & Technology Source
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  Availability: 0
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DbLabel: Applied Science & Technology Source
An: 194015162
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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      – Type: doi
        Value: 10.1002/adfm.202528142
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      – Code: eng
        Text: English
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        PageCount: 22
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      – TitleFull: From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.
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            NameFull: Li, Jianyu
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            NameFull: Hu, Ertao
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            NameFull: Wei, Wei
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              Text: May2026
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              Y: 2026
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              Value: 36
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              Value: 41
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            – TitleFull: Advanced Functional Materials
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