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From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.

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Bibliographic Details
Title:	From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.
Authors:	Li, Jianyu¹, Hu, Ertao², Wei, Wei², Shi, Feifei^1,3, feifeishi@psu.edu
Source:	Advanced Functional Materials; May2026, Vol. 36 Issue 41, p1-22, 22p
Database:	Applied Science & Technology Source

Description
ISSN:	1616301X
DOI:	10.1002/adfm.202528142