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From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.

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Bibliographic Details
Title: From Wafers to Electrodes: Transferring Automatic Optical Inspection (AOI) for Multiscale Characterization of Smart Battery Manufacturing.
Authors: Li, Jianyu1, Hu, Ertao2, Wei, Wei2, Shi, Feifei1,3, feifeishi@psu.edu
Source: Advanced Functional Materials; May2026, Vol. 36 Issue 41, p1-22, 22p
Database: Applied Science & Technology Source
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