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Enhanced Ferroelectricity and Reliability in Hf0.5Zr0.5O2 Thin Film via Synergistic Stress-Interface Effects from a W Top Electrode.

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Title: Enhanced Ferroelectricity and Reliability in Hf0.5Zr0.5O2 Thin Film via Synergistic Stress-Interface Effects from a W Top Electrode.
Authors: Wang, Dao1, Zhang, Yan2, 2022076@htu.edu.cn, Xu, Fan3, Wang, Xin-Yuan2, Lu, Zi-Hao2, Fu, Hui-Wen1, He, Dan-Feng1
Source: Journal of Electronic Materials; Jul2026, Vol. 55 Issue 7, p5807-5816, 10p
Database: Applied Science & Technology Source
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  Availability: 0
Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 194546554
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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Items – Name: Title
  Label: Title
  Group: Ti
  Data: Enhanced Ferroelectricity and Reliability in Hf0.5Zr0.5O2 Thin Film via Synergistic Stress-Interface Effects from a W Top Electrode.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22Wang%2C+Dao%22">Wang, Dao</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Yan%22">Zhang, Yan</searchLink><relatesTo>2</relatesTo>, <i>2022076@htu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Xu%2C+Fan%22">Xu, Fan</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Wang%2C+Xin-Yuan%22">Wang, Xin-Yuan</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Lu%2C+Zi-Hao%22">Lu, Zi-Hao</searchLink><relatesTo>2</relatesTo><br /><searchLink fieldCode="AU" term="%22Fu%2C+Hui-Wen%22">Fu, Hui-Wen</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22He%2C+Dan-Feng%22">He, Dan-Feng</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Jul2026, Vol. 55 Issue 7, p5807-5816, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194546554
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.1007/s11664-026-12815-z
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 10
        StartPage: 5807
    Titles:
      – TitleFull: Enhanced Ferroelectricity and Reliability in Hf0.5Zr0.5O2 Thin Film via Synergistic Stress-Interface Effects from a W Top Electrode.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: Wang, Dao
      – PersonEntity:
          Name:
            NameFull: Zhang, Yan
      – PersonEntity:
          Name:
            NameFull: Xu, Fan
      – PersonEntity:
          Name:
            NameFull: Wang, Xin-Yuan
      – PersonEntity:
          Name:
            NameFull: Lu, Zi-Hao
      – PersonEntity:
          Name:
            NameFull: Fu, Hui-Wen
      – PersonEntity:
          Name:
            NameFull: He, Dan-Feng
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 01
              M: 07
              Text: Jul2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 03615235
          Numbering:
            – Type: volume
              Value: 55
            – Type: issue
              Value: 7
          Titles:
            – TitleFull: Journal of Electronic Materials
              Type: main
ResultId 1