Enhanced Ferroelectricity and Reliability in Hf0.5Zr0.5O2 Thin Film via Synergistic Stress-Interface Effects from a W Top Electrode. - Wang, Dao; Zhang, Yan; Xu, Fan; Wang, Xin-Yuan; Lu, Zi-Hao; Fu, Hui-Wen; He, Dan-Feng (Journal of Electronic Materials, 2026)