Microstructural Refinement and Interfacial Evolution of Ge addition Sn-Bi-Zn Medium-Entropy Solders.
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| Title: | Microstructural Refinement and Interfacial Evolution of Ge addition Sn-Bi-Zn Medium-Entropy Solders. |
|---|---|
| Authors: | Li, Su1,2, Yue, Zhiyang1,2, Huang, Jianeng1,2, Dai, Pinqiang1,2, Pan, Huiyuan1,2, Tian, Jun1,2, tianj2003@126.com, Lin, Chun-Ming3, chunming@nkust.edu.tw |
| Source: | Journal of Electronic Materials; Jul2026, Vol. 55 Issue 7, p6337-6350, 14p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 194546576 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Microstructural Refinement and Interfacial Evolution of Ge addition Sn-Bi-Zn Medium-Entropy Solders. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Li%2C+Su%22">Li, Su</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Yue%2C+Zhiyang%22">Yue, Zhiyang</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Huang%2C+Jianeng%22">Huang, Jianeng</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Dai%2C+Pinqiang%22">Dai, Pinqiang</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Pan%2C+Huiyuan%22">Pan, Huiyuan</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Tian%2C+Jun%22">Tian, Jun</searchLink><relatesTo>1,2</relatesTo>, <i>tianj2003@126.com</i><br /><searchLink fieldCode="AU" term="%22Lin%2C+Chun-Ming%22">Lin, Chun-Ming</searchLink><relatesTo>3</relatesTo>, <i>chunming@nkust.edu.tw</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Electronic+Materials%22">Journal of Electronic Materials</searchLink>; Jul2026, Vol. 55 Issue 7, p6337-6350, 14p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194546576 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1007/s11664-026-12881-3 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 14 StartPage: 6337 Titles: – TitleFull: Microstructural Refinement and Interfacial Evolution of Ge addition Sn-Bi-Zn Medium-Entropy Solders. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Li, Su – PersonEntity: Name: NameFull: Yue, Zhiyang – PersonEntity: Name: NameFull: Huang, Jianeng – PersonEntity: Name: NameFull: Dai, Pinqiang – PersonEntity: Name: NameFull: Pan, Huiyuan – PersonEntity: Name: NameFull: Tian, Jun – PersonEntity: Name: NameFull: Lin, Chun-Ming IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 03615235 Numbering: – Type: volume Value: 55 – Type: issue Value: 7 Titles: – TitleFull: Journal of Electronic Materials Type: main |
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