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Direct resist-free patterning of an organic semiconductor via thermal scanning probe lithography.

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Title: Direct resist-free patterning of an organic semiconductor via thermal scanning probe lithography.
Authors: Luo, Kaimin1,2, LKM@mail.sim.ac.cn, Li, Jun1, lj@mail.sim.ac.cn, Gu, Yanshu1,2, gu_yanshu@mail.sim.ac.cn, Ma, Tianlei1, matianlei@mail.sim.ac.cn, Zhang, Jingyuan1, 2511883@tongji.edu.cn, Cao, Liying1, liying_cao2026@163.com, Zhu, Zhaohui1, zhuzh@mail.sim.ac.cn, Tang, Heng1, th123@mail.sim.ac.cn, Xu, Pengcheng1,2, xpc@mail.sim.ac.cn, Jia, Hao1,2, hao.jia@mail.sim.ac.cn, Tu, Min1,3, mintu@shu.edu.cn, Li, Xinxin1,2, xxli@mail.sim.ac.cn
Source: Discover Nano; 6/21/2026, Vol. 21 Issue 1, p1-11, 11p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 194723801
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: Direct resist-free patterning of an organic semiconductor via thermal scanning probe lithography.
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  Data: <searchLink fieldCode="AU" term="%22Luo%2C+Kaimin%22">Luo, Kaimin</searchLink><relatesTo>1,2</relatesTo>, <i>LKM@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Li%2C+Jun%22">Li, Jun</searchLink><relatesTo>1</relatesTo>, <i>lj@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Gu%2C+Yanshu%22">Gu, Yanshu</searchLink><relatesTo>1,2</relatesTo>, <i>gu_yanshu@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Ma%2C+Tianlei%22">Ma, Tianlei</searchLink><relatesTo>1</relatesTo>, <i>matianlei@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Jingyuan%22">Zhang, Jingyuan</searchLink><relatesTo>1</relatesTo>, <i>2511883@tongji.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Cao%2C+Liying%22">Cao, Liying</searchLink><relatesTo>1</relatesTo>, <i>liying_cao2026@163.com</i><br /><searchLink fieldCode="AU" term="%22Zhu%2C+Zhaohui%22">Zhu, Zhaohui</searchLink><relatesTo>1</relatesTo>, <i>zhuzh@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Tang%2C+Heng%22">Tang, Heng</searchLink><relatesTo>1</relatesTo>, <i>th123@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Xu%2C+Pengcheng%22">Xu, Pengcheng</searchLink><relatesTo>1,2</relatesTo>, <i>xpc@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Jia%2C+Hao%22">Jia, Hao</searchLink><relatesTo>1,2</relatesTo>, <i>hao.jia@mail.sim.ac.cn</i><br /><searchLink fieldCode="AU" term="%22Tu%2C+Min%22">Tu, Min</searchLink><relatesTo>1,3</relatesTo>, <i>mintu@shu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Li%2C+Xinxin%22">Li, Xinxin</searchLink><relatesTo>1,2</relatesTo>, <i>xxli@mail.sim.ac.cn</i>
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  Data: <searchLink fieldCode="JN" term="%22Discover+Nano%22">Discover Nano</searchLink>; 6/21/2026, Vol. 21 Issue 1, p1-11, 11p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194723801
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        Value: 10.1186/s11671-026-04658-8
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        Text: English
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              Text: 6/21/2026
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