APA (7th ed.) Citation

Li, H., Wang, Y., Liu, J., & Liu, H. (2026). A Data-Driven Defect Diagnosis and Failure Analysis Method for Mass-Production SRAM Redundancy Optimization. Applied Sciences (2076-3417), 16(11), 5381. https://doi.org/10.3390/app16115381

Chicago Style (17th ed.) Citation

Li, Hailong, Yun Wang, Jian Liu, and Haiyang Liu. "A Data-Driven Defect Diagnosis and Failure Analysis Method for Mass-Production SRAM Redundancy Optimization." Applied Sciences (2076-3417) 16, no. 11 (2026): 5381. https://doi.org/10.3390/app16115381.

MLA (9th ed.) Citation

Li, Hailong, et al. "A Data-Driven Defect Diagnosis and Failure Analysis Method for Mass-Production SRAM Redundancy Optimization." Applied Sciences (2076-3417), vol. 16, no. 11, 2026, p. 5381, https://doi.org/10.3390/app16115381.