A Data-Driven Defect Diagnosis and Failure Analysis Method for Mass-Production SRAM Redundancy Optimization.
Saved in:
| Title: | A Data-Driven Defect Diagnosis and Failure Analysis Method for Mass-Production SRAM Redundancy Optimization. |
|---|---|
| Authors: | Li, Hailong1,2, liuhaiyang@ime.ac.cn, Wang, Yun2,3, Liu, Jian1,2,3, Liu, Haiyang1,2 |
| Source: | Applied Sciences (2076-3417); Jun2026, Vol. 16 Issue 11, p5381, 26p |
| Database: | Applied Science & Technology Source |
|
Full text is not displayed to guests.
Login for full access.
|
|
| ISSN: | 20763417 |
|---|---|
| DOI: | 10.3390/app16115381 |
