APA (7th ed.) Citation

Lema, D. G., Sánchez-González, L., Usamentiaga, R., & delaCalle, F. J. (2026). Benchmarking deep learning models for surface defect detection: A reproducible and statistically-rigorous approach. Journal of Intelligent Manufacturing, 37(7), 3001. https://doi.org/10.1007/s10845-025-02672-8

Chicago Style (17th ed.) Citation

Lema, Darío G., Lidia Sánchez-González, Rubén Usamentiaga, and F. J. delaCalle. "Benchmarking Deep Learning Models for Surface Defect Detection: A Reproducible and Statistically-rigorous Approach." Journal of Intelligent Manufacturing 37, no. 7 (2026): 3001. https://doi.org/10.1007/s10845-025-02672-8.

MLA (9th ed.) Citation

Lema, Darío G., et al. "Benchmarking Deep Learning Models for Surface Defect Detection: A Reproducible and Statistically-rigorous Approach." Journal of Intelligent Manufacturing, vol. 37, no. 7, 2026, p. 3001, https://doi.org/10.1007/s10845-025-02672-8.