Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.
Saved in:
| Title: | Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging. |
|---|---|
| Authors: | Shoji, Eita1, eita.shoji@tohoku.ac.jp, Aizawa, Keita1, Kusudo, Hiroki1, Biwa, Tetsushi1 |
| Source: | Advanced Materials Interfaces; 6/23/2026, Vol. 13 Issue 12, p1-10, 10p |
| Database: | Applied Science & Technology Source |
| ISSN: | 21967350 |
|---|---|
| DOI: | 10.1002/admi.70546 |
