Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.

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Title: Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.
Authors: Shoji, Eita1, eita.shoji@tohoku.ac.jp, Aizawa, Keita1, Kusudo, Hiroki1, Biwa, Tetsushi1
Source: Advanced Materials Interfaces; 6/23/2026, Vol. 13 Issue 12, p1-10, 10p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 194812309
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PubType: Academic Journal
PubTypeId: academicJournal
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  Data: Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.
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  Data: <searchLink fieldCode="AU" term="%22Shoji%2C+Eita%22">Shoji, Eita</searchLink><relatesTo>1</relatesTo>, <i>eita.shoji@tohoku.ac.jp</i><br /><searchLink fieldCode="AU" term="%22Aizawa%2C+Keita%22">Aizawa, Keita</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kusudo%2C+Hiroki%22">Kusudo, Hiroki</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Biwa%2C+Tetsushi%22">Biwa, Tetsushi</searchLink><relatesTo>1</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Materials+Interfaces%22">Advanced Materials Interfaces</searchLink>; 6/23/2026, Vol. 13 Issue 12, p1-10, 10p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194812309
RecordInfo BibRecord:
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      – Type: doi
        Value: 10.1002/admi.70546
    Languages:
      – Code: eng
        Text: English
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        PageCount: 10
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      – TitleFull: Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.
        Type: main
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            NameFull: Shoji, Eita
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            NameFull: Aizawa, Keita
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            NameFull: Kusudo, Hiroki
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            NameFull: Biwa, Tetsushi
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            – D: 23
              M: 06
              Text: 6/23/2026
              Type: published
              Y: 2026
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              Value: 13
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              Value: 12
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            – TitleFull: Advanced Materials Interfaces
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