Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging.
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| Title: | Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging. |
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| Authors: | Shoji, Eita1, eita.shoji@tohoku.ac.jp, Aizawa, Keita1, Kusudo, Hiroki1, Biwa, Tetsushi1 |
| Source: | Advanced Materials Interfaces; 6/23/2026, Vol. 13 Issue 12, p1-10, 10p |
| Database: | Applied Science & Technology Source |
| FullText | Text: Availability: 0 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 194812309 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Shoji%2C+Eita%22">Shoji, Eita</searchLink><relatesTo>1</relatesTo>, <i>eita.shoji@tohoku.ac.jp</i><br /><searchLink fieldCode="AU" term="%22Aizawa%2C+Keita%22">Aizawa, Keita</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Kusudo%2C+Hiroki%22">Kusudo, Hiroki</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Biwa%2C+Tetsushi%22">Biwa, Tetsushi</searchLink><relatesTo>1</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Advanced+Materials+Interfaces%22">Advanced Materials Interfaces</searchLink>; 6/23/2026, Vol. 13 Issue 12, p1-10, 10p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=194812309 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1002/admi.70546 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 10 StartPage: 1 Titles: – TitleFull: Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Shoji, Eita – PersonEntity: Name: NameFull: Aizawa, Keita – PersonEntity: Name: NameFull: Kusudo, Hiroki – PersonEntity: Name: NameFull: Biwa, Tetsushi IsPartOfRelationships: – BibEntity: Dates: – D: 23 M: 06 Text: 6/23/2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 21967350 Numbering: – Type: volume Value: 13 – Type: issue Value: 12 Titles: – TitleFull: Advanced Materials Interfaces Type: main |
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