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Thermal Nonuniformity-Aware Reliability Screening for Systolic AI Accelerators.

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Bibliographic Details
Title:	Thermal Nonuniformity-Aware Reliability Screening for Systolic AI Accelerators.
Authors:	Goffman-Vinopal, Larisa¹
Source:	Journal of Low Power Electronics & Applications; Jun2026, Vol. 16 Issue 2, p18, 23p
Database:	Applied Science & Technology Source
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Description
ISSN:	20799268
DOI:	10.3390/jlpea16020018