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Thermal Nonuniformity-Aware Reliability Screening for Systolic AI Accelerators.

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Bibliographic Details
Title: Thermal Nonuniformity-Aware Reliability Screening for Systolic AI Accelerators.
Authors: Goffman-Vinopal, Larisa1
Source: Journal of Low Power Electronics & Applications; Jun2026, Vol. 16 Issue 2, p18, 23p
Database: Applied Science & Technology Source
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        Value: 10.3390/jlpea16020018
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        Text: English
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              Text: Jun2026
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              Y: 2026
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