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Verification of training and compensation under variations: simulation and measurement on oxide semiconductor analog in-memory computing chips.

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Title: Verification of training and compensation under variations: simulation and measurement on oxide semiconductor analog in-memory computing chips.
Authors: Tsutsui, Naoaki1, tsutsui@sel.co.jp, Akimoto, Kengo1, akimoto@sel.co.jp, Imaizumi, Takaaki1, Tsuda, Kazuki1, Koumura, Yusuke1, Kimura, Kiyotaka1, Nakazato, Ryo1, Tani, Chizuko1, Fukumoto, Takafumi1, Ando, Yoshinori1, Yakubo, Yuto1, Nakura, Toru2, Yamazaki, Shunpei1
Source: npj Unconventional Computing; 7/2/2026, Vol. 3 Issue 1, p1-7, 7p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
An: 195072796
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PubType: Academic Journal
PubTypeId: academicJournal
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        Value: 10.1038/s44335-026-00074-4
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              Text: 7/2/2026
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              Y: 2026
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