Reliability of the Digital Models of Open/Short-Circuited Coupled-Line Branch-Line Structures.

Saved in:

Bibliographic Details
Title:	Reliability of the Digital Models of Open/Short-Circuited Coupled-Line Branch-Line Structures.
Authors:	Stošić, Biljana P.¹, biljana.stosic@elfak.ni.ac.rs, Nedelchev, Marin², mnedelchev@tu-sofia.bg
Source:	Microwave Review; Jul2026, Vol. 32 Issue 1, p20-27, 8p
Database:	Applied Science & Technology Source

Description
ISSN:	14505835
DOI:	10.18485/mtts_mr.2026.32.1.4