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High-temperature electrical performance and interface adhesion performance of SiC-based Pt thin-film RTDs.

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Title: High-temperature electrical performance and interface adhesion performance of SiC-based Pt thin-film RTDs.
Authors: Fang, Ziyan1,2, Fang, Xudong1,2,3,4, dongfangshuo30@xjtu.edu.cn, Wu, Chen1,2, Sun, Hao1,2, Zhang, Yong3, Zhang, Zhongkai1,2,4, Tian, Bian1,2,4, Yuan, Hai5, Verma, Prateek6, Maeda, Ryutaro1,7
Source: Microsystems & Nanoengineering; 7/6/2026, Vol. 12 Issue 1, p1-15, 15p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 195117781
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
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  Data: High-temperature electrical performance and interface adhesion performance of SiC-based Pt thin-film RTDs.
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  Data: <searchLink fieldCode="AU" term="%22Fang%2C+Ziyan%22">Fang, Ziyan</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Fang%2C+Xudong%22">Fang, Xudong</searchLink><relatesTo>1,2,3,4</relatesTo>, <i>dongfangshuo30@xjtu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wu%2C+Chen%22">Wu, Chen</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Sun%2C+Hao%22">Sun, Hao</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Yong%22">Zhang, Yong</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Zhongkai%22">Zhang, Zhongkai</searchLink><relatesTo>1,2,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Tian%2C+Bian%22">Tian, Bian</searchLink><relatesTo>1,2,4</relatesTo><br /><searchLink fieldCode="AU" term="%22Yuan%2C+Hai%22">Yuan, Hai</searchLink><relatesTo>5</relatesTo><br /><searchLink fieldCode="AU" term="%22Verma%2C+Prateek%22">Verma, Prateek</searchLink><relatesTo>6</relatesTo><br /><searchLink fieldCode="AU" term="%22Maeda%2C+Ryutaro%22">Maeda, Ryutaro</searchLink><relatesTo>1,7</relatesTo>
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  Data: <searchLink fieldCode="JN" term="%22Microsystems+%26+Nanoengineering%22">Microsystems & Nanoengineering</searchLink>; 7/6/2026, Vol. 12 Issue 1, p1-15, 15p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195117781
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        Value: 10.1038/s41378-026-01350-w
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        Text: English
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              Text: 7/6/2026
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              Y: 2026
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