APA (7th ed.) Citation

Zhang, L., Liu, Q., Cao, X., Zhang, Y., Sun, J., Cui, M., . . . Bansal, S. (2026). YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism. Journal of Electrical & Computer Engineering, 2026, 1. https://doi.org/10.1155/jece/2638110

Chicago Style (17th ed.) Citation

Zhang, Lianlian, Qi Liu, Xiaorui Cao, Yujin Zhang, Jie Sun, Mengmeng Cui, Xiaoru Ren, Di Wu, and Shonak Bansal. "YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism." Journal of Electrical & Computer Engineering 2026 (2026): 1. https://doi.org/10.1155/jece/2638110.

MLA (9th ed.) Citation

Zhang, Lianlian, et al. "YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism." Journal of Electrical & Computer Engineering, vol. 2026, 2026, p. 1, https://doi.org/10.1155/jece/2638110.