YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism.
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| Title: | YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism. |
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| Authors: | Zhang, Lianlian1, Liu, Qi1, Cao, Xiaorui1, Zhang, Yujin2, zyj1219@hebiace.edu.cn, Sun, Jie3, Cui, Mengmeng4, Ren, Xiaoru1, Wu, Di1, Bansal, Shonak, shonakk@gmail.com |
| Source: | Journal of Electrical & Computer Engineering; 7/6/2026, Vol. 2026, p1-12, 12p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 195154110 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Zhang%2C+Lianlian%22">Zhang, Lianlian</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Liu%2C+Qi%22">Liu, Qi</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Cao%2C+Xiaorui%22">Cao, Xiaorui</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Zhang%2C+Yujin%22">Zhang, Yujin</searchLink><relatesTo>2</relatesTo>, <i>zyj1219@hebiace.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Sun%2C+Jie%22">Sun, Jie</searchLink><relatesTo>3</relatesTo><br /><searchLink fieldCode="AU" term="%22Cui%2C+Mengmeng%22">Cui, Mengmeng</searchLink><relatesTo>4</relatesTo><br /><searchLink fieldCode="AU" term="%22Ren%2C+Xiaoru%22">Ren, Xiaoru</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Wu%2C+Di%22">Wu, Di</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Bansal%2C+Shonak%22">Bansal, Shonak</searchLink>, <i>shonakk@gmail.com</i> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Journal+of+Electrical+%26+Computer+Engineering%22">Journal of Electrical & Computer Engineering</searchLink>; 7/6/2026, Vol. 2026, p1-12, 12p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195154110 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1155/jece/2638110 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 12 StartPage: 1 Titles: – TitleFull: YOLOv11‐DDP: An Accuracy‐Enhanced PCB Defect Detection Algorithm Featuring Dynamic Feature Fusion and DAT Attention Mechanism. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Zhang, Lianlian – PersonEntity: Name: NameFull: Liu, Qi – PersonEntity: Name: NameFull: Cao, Xiaorui – PersonEntity: Name: NameFull: Zhang, Yujin – PersonEntity: Name: NameFull: Sun, Jie – PersonEntity: Name: NameFull: Cui, Mengmeng – PersonEntity: Name: NameFull: Ren, Xiaoru – PersonEntity: Name: NameFull: Wu, Di – PersonEntity: Name: NameFull: Bansal, Shonak IsPartOfRelationships: – BibEntity: Dates: – D: 06 M: 07 Text: 7/6/2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20900147 Numbering: – Type: volume Value: 2026 Titles: – TitleFull: Journal of Electrical & Computer Engineering Type: main |
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