APA (7th ed.) Citation

Vieira, D. H., de Paula, A. C., Dias, J. D. F., Fung, M. H. L. O., de Oliveira, R. F., Nogueira, G. L., . . . Alves, N. (2026). Aging and Electrical Stability of DNTT Honey‐Gated OFETs. Advanced Electronic Materials, 12(13), 1. https://doi.org/10.1002/aelm.202500786

Chicago Style (17th ed.) Citation

Vieira, Douglas H., Ana C. de Paula, José D. F. Dias, Maria H. L. O. Fung, Rafael Furlan de Oliveira, Gabriel L. Nogueira, Keli F. Seidel, José P. M. Serbena, and Neri Alves. "Aging and Electrical Stability of DNTT Honey‐Gated OFETs." Advanced Electronic Materials 12, no. 13 (2026): 1. https://doi.org/10.1002/aelm.202500786.

MLA (9th ed.) Citation

Vieira, Douglas H., et al. "Aging and Electrical Stability of DNTT Honey‐Gated OFETs." Advanced Electronic Materials, vol. 12, no. 13, 2026, p. 1, https://doi.org/10.1002/aelm.202500786.