Aging and Electrical Stability of DNTT Honey‐Gated OFETs.
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| Title: | Aging and Electrical Stability of DNTT Honey‐Gated OFETs. |
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| Authors: | Vieira, Douglas H.1, de Paula, Ana C.2, Dias, José D. F.1, jd.fernandes@unesp.br, Fung, Maria H. L. O.2, de Oliveira, Rafael Furlan3, Nogueira, Gabriel L.4, Seidel, Keli F.5, Serbena, José P. M.2, joseserbena@ufpr.br, Alves, Neri1, neri.alves@unesp.br |
| Source: | Advanced Electronic Materials; 7/6/2026, Vol. 12 Issue 13, p1-11, 11p |
| Database: | Applied Science & Technology Source |
| ISSN: | 2199160X |
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| DOI: | 10.1002/aelm.202500786 |
