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Aging and Electrical Stability of DNTT Honey‐Gated OFETs.

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Title: Aging and Electrical Stability of DNTT Honey‐Gated OFETs.
Authors: Vieira, Douglas H.1, de Paula, Ana C.2, Dias, José D. F.1, jd.fernandes@unesp.br, Fung, Maria H. L. O.2, de Oliveira, Rafael Furlan3, Nogueira, Gabriel L.4, Seidel, Keli F.5, Serbena, José P. M.2, joseserbena@ufpr.br, Alves, Neri1, neri.alves@unesp.br
Source: Advanced Electronic Materials; 7/6/2026, Vol. 12 Issue 13, p1-11, 11p
Database: Applied Science & Technology Source
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  Data: <searchLink fieldCode="JN" term="%22Advanced+Electronic+Materials%22">Advanced Electronic Materials</searchLink>; 7/6/2026, Vol. 12 Issue 13, p1-11, 11p
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        Value: 10.1002/aelm.202500786
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