Aging and Electrical Stability of DNTT Honey‐Gated OFETs. - Vieira, Douglas H.; de Paula, Ana C.; Dias, José D. F.; Fung, Maria H. L. O.; de Oliveira, Rafael Furlan; Nogueira, Gabriel L.; Seidel, Keli F.; Serbena, José P. M.; Alves, Neri (Advanced Electronic Materials, 2026)