APA (7th ed.) Citation

Son, S., Kang, D., & Choi, D. (2026). Deep Learning-Enhanced Real-Time Defect Detection System for Tungsten Manufacturing. KSII Transactions on Internet & Information Systems, 20(6), 3048. https://doi.org/10.3837/tiis.2026.06.011

Chicago Style (17th ed.) Citation

Son, Seung-Yong, Dong-Ju Kang, and Doo-Hyun Choi. "Deep Learning-Enhanced Real-Time Defect Detection System for Tungsten Manufacturing." KSII Transactions on Internet & Information Systems 20, no. 6 (2026): 3048. https://doi.org/10.3837/tiis.2026.06.011.

MLA (9th ed.) Citation

Son, Seung-Yong, et al. "Deep Learning-Enhanced Real-Time Defect Detection System for Tungsten Manufacturing." KSII Transactions on Internet & Information Systems, vol. 20, no. 6, 2026, p. 3048, https://doi.org/10.3837/tiis.2026.06.011.