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Autonomous Defect Classification in Manufacturing: A Novel Few-Shot Vision-Language Modeling Approach.

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Title: Autonomous Defect Classification in Manufacturing: A Novel Few-Shot Vision-Language Modeling Approach.
Authors: Dinh, Hoang Long1, hoanglongnra@gmail.com, Doan, Diem Vuong1, vuongdd@epu.edu.vn, Nguyen, Ngoc Khoat1, khoatnn@epu.edu.vn, Nguyen, Duy Trung1, trungnd@epu.edu.vn, Hoang, Huy Hoang1, hoanghh0609@gmail.com
Source: Engineering, Technology & Applied Science Research; Jun2026, Vol. 16 Issue 3, p36545-36551, 7p
Database: Applied Science & Technology Source
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DbLabel: Applied Science & Technology Source
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PubType: Academic Journal
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  Data: Autonomous Defect Classification in Manufacturing: A Novel Few-Shot Vision-Language Modeling Approach.
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  Data: <searchLink fieldCode="AU" term="%22Dinh%2C+Hoang+Long%22">Dinh, Hoang Long</searchLink><relatesTo>1</relatesTo>, <i>hoanglongnra@gmail.com</i><br /><searchLink fieldCode="AU" term="%22Doan%2C+Diem+Vuong%22">Doan, Diem Vuong</searchLink><relatesTo>1</relatesTo>, <i>vuongdd@epu.edu.vn</i><br /><searchLink fieldCode="AU" term="%22Nguyen%2C+Ngoc+Khoat%22">Nguyen, Ngoc Khoat</searchLink><relatesTo>1</relatesTo>, <i>khoatnn@epu.edu.vn</i><br /><searchLink fieldCode="AU" term="%22Nguyen%2C+Duy+Trung%22">Nguyen, Duy Trung</searchLink><relatesTo>1</relatesTo>, <i>trungnd@epu.edu.vn</i><br /><searchLink fieldCode="AU" term="%22Hoang%2C+Huy+Hoang%22">Hoang, Huy Hoang</searchLink><relatesTo>1</relatesTo>, <i>hoanghh0609@gmail.com</i>
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      – Type: doi
        Value: 10.48084/etasr.18859
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      – Code: eng
        Text: English
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      – TitleFull: Autonomous Defect Classification in Manufacturing: A Novel Few-Shot Vision-Language Modeling Approach.
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            NameFull: Dinh, Hoang Long
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            – D: 01
              M: 06
              Text: Jun2026
              Type: published
              Y: 2026
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