APA (7th ed.) Citation

Méndez-González, L. C., Rodríguez-Picón, L. A., González-Hernández, I. J., Pérez-Olguín, I. J. C., & García, V. (2026). Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios. Applied Sciences (2076-3417), 16(13), 6588. https://doi.org/10.3390/app16136588

Chicago Style (17th ed.) Citation

Méndez-González, Luis Carlos, Luis Alberto Rodríguez-Picón, Isidro Jesús González-Hernández, Iván Juan Carlos Pérez-Olguín, and Vicente García. "Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios." Applied Sciences (2076-3417) 16, no. 13 (2026): 6588. https://doi.org/10.3390/app16136588.

MLA (9th ed.) Citation

Méndez-González, Luis Carlos, et al. "Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios." Applied Sciences (2076-3417), vol. 16, no. 13, 2026, p. 6588, https://doi.org/10.3390/app16136588.