Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios.
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| Title: | Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios. |
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| Authors: | Méndez-González, Luis Carlos1, luis.mendez@uacj.mx, Rodríguez-Picón, Luis Alberto1,2, González-Hernández, Isidro Jesús2,3, Pérez-Olguín, Iván Juan Carlos1, García, Vicente2,3 |
| Source: | Applied Sciences (2076-3417); Jul2026, Vol. 16 Issue 13, p6588, 44p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 195445813 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Méndez-González%2C+Luis+Carlos%22">Méndez-González, Luis Carlos</searchLink><relatesTo>1</relatesTo>, <i>luis.mendez@uacj.mx</i><br /><searchLink fieldCode="AU" term="%22Rodríguez-Picón%2C+Luis+Alberto%22">Rodríguez-Picón, Luis Alberto</searchLink><relatesTo>1,2</relatesTo><br /><searchLink fieldCode="AU" term="%22González-Hernández%2C+Isidro+Jesús%22">González-Hernández, Isidro Jesús</searchLink><relatesTo>2,3</relatesTo><br /><searchLink fieldCode="AU" term="%22Pérez-Olguín%2C+Iván+Juan+Carlos%22">Pérez-Olguín, Iván Juan Carlos</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22García%2C+Vicente%22">García, Vicente</searchLink><relatesTo>2,3</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Sciences+%282076-3417%29%22">Applied Sciences (2076-3417)</searchLink>; Jul2026, Vol. 16 Issue 13, p6588, 44p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195445813 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/app16136588 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 44 StartPage: 6588 Titles: – TitleFull: Flexible Reliability Assessment of Electronic Components Under Complex Failure-Mode Scenarios. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Méndez-González, Luis Carlos – PersonEntity: Name: NameFull: Rodríguez-Picón, Luis Alberto – PersonEntity: Name: NameFull: González-Hernández, Isidro Jesús – PersonEntity: Name: NameFull: Pérez-Olguín, Iván Juan Carlos – PersonEntity: Name: NameFull: García, Vicente IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20763417 Numbering: – Type: volume Value: 16 – Type: issue Value: 13 Titles: – TitleFull: Applied Sciences (2076-3417) Type: main |
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