MA-YOLO: Morphology-Adaptive YOLO for Parameter-Efficient PCB Defect Detection.
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| Title: | MA-YOLO: Morphology-Adaptive YOLO for Parameter-Efficient PCB Defect Detection. |
|---|---|
| Authors: | Zhang, Jieping1, Lv, Jinna1,2, lvjinna@bistu.edu.cn, Wang, Yueming1, Sun, Yinan1, Li, Weihan1, Li, Chaozhi2 |
| Source: | Applied Sciences (2076-3417); Jul2026, Vol. 16 Issue 13, p6828, 32p |
| Database: | Applied Science & Technology Source |
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| FullText | Links: – Type: pdflink Text: Availability: 1 |
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| Header | DbId: aci DbLabel: Applied Science & Technology Source An: 195446053 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 0 |
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| Items | – Name: Title Label: Title Group: Ti Data: MA-YOLO: Morphology-Adaptive YOLO for Parameter-Efficient PCB Defect Detection. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AU" term="%22Zhang%2C+Jieping%22">Zhang, Jieping</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Lv%2C+Jinna%22">Lv, Jinna</searchLink><relatesTo>1,2</relatesTo>, <i>lvjinna@bistu.edu.cn</i><br /><searchLink fieldCode="AU" term="%22Wang%2C+Yueming%22">Wang, Yueming</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Sun%2C+Yinan%22">Sun, Yinan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Weihan%22">Li, Weihan</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Li%2C+Chaozhi%22">Li, Chaozhi</searchLink><relatesTo>2</relatesTo> – Name: TitleSource Label: Source Group: Src Data: <searchLink fieldCode="JN" term="%22Applied+Sciences+%282076-3417%29%22">Applied Sciences (2076-3417)</searchLink>; Jul2026, Vol. 16 Issue 13, p6828, 32p |
| PLink | https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195446053 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.3390/app16136828 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 32 StartPage: 6828 Titles: – TitleFull: MA-YOLO: Morphology-Adaptive YOLO for Parameter-Efficient PCB Defect Detection. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Zhang, Jieping – PersonEntity: Name: NameFull: Lv, Jinna – PersonEntity: Name: NameFull: Wang, Yueming – PersonEntity: Name: NameFull: Sun, Yinan – PersonEntity: Name: NameFull: Li, Weihan – PersonEntity: Name: NameFull: Li, Chaozhi IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 07 Text: Jul2026 Type: published Y: 2026 Identifiers: – Type: issn-print Value: 20763417 Numbering: – Type: volume Value: 16 – Type: issue Value: 13 Titles: – TitleFull: Applied Sciences (2076-3417) Type: main |
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