APA (7th ed.) Citation

del-Hoyo-Gabaldon, J., Garcia-Cabot, A., Garcia-Lopez, E., & de-Fitero-Dominguez, D. (2026). Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models. Applied Sciences (2076-3417), 16(14), 7170. https://doi.org/10.3390/app16147170

Chicago Style (17th ed.) Citation

del-Hoyo-Gabaldon, Jesus-Angel, Antonio Garcia-Cabot, Eva Garcia-Lopez, and David de-Fitero-Dominguez. "Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models." Applied Sciences (2076-3417) 16, no. 14 (2026): 7170. https://doi.org/10.3390/app16147170.

MLA (9th ed.) Citation

del-Hoyo-Gabaldon, Jesus-Angel, et al. "Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models." Applied Sciences (2076-3417), vol. 16, no. 14, 2026, p. 7170, https://doi.org/10.3390/app16147170.