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Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models.

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Title: Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models.
Authors: del-Hoyo-Gabaldon, Jesus-Angel1, Garcia-Cabot, Antonio1, a.garciac@uah.es, Garcia-Lopez, Eva1, de-Fitero-Dominguez, David1
Source: Applied Sciences (2076-3417); Jul2026, Vol. 16 Issue 14, p7170, 19p
Database: Applied Science & Technology Source
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Header DbId: aci
DbLabel: Applied Science & Technology Source
An: 195811660
AccessLevel: 2
PubType: Academic Journal
PubTypeId: academicJournal
PreciseRelevancyScore: 0
IllustrationInfo
Items – Name: Title
  Label: Title
  Group: Ti
  Data: Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models.
– Name: Author
  Label: Authors
  Group: Au
  Data: <searchLink fieldCode="AU" term="%22del-Hoyo-Gabaldon%2C+Jesus-Angel%22">del-Hoyo-Gabaldon, Jesus-Angel</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22Garcia-Cabot%2C+Antonio%22">Garcia-Cabot, Antonio</searchLink><relatesTo>1</relatesTo>, <i>a.garciac@uah.es</i><br /><searchLink fieldCode="AU" term="%22Garcia-Lopez%2C+Eva%22">Garcia-Lopez, Eva</searchLink><relatesTo>1</relatesTo><br /><searchLink fieldCode="AU" term="%22de-Fitero-Dominguez%2C+David%22">de-Fitero-Dominguez, David</searchLink><relatesTo>1</relatesTo>
– Name: TitleSource
  Label: Source
  Group: Src
  Data: <searchLink fieldCode="JN" term="%22Applied+Sciences+%282076-3417%29%22">Applied Sciences (2076-3417)</searchLink>; Jul2026, Vol. 16 Issue 14, p7170, 19p
PLink https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&db=aci&AN=195811660
RecordInfo BibRecord:
  BibEntity:
    Identifiers:
      – Type: doi
        Value: 10.3390/app16147170
    Languages:
      – Code: eng
        Text: English
    PhysicalDescription:
      Pagination:
        PageCount: 19
        StartPage: 7170
    Titles:
      – TitleFull: Test-Free Fault Localization Through Deep Source Code Analysis Using Encoder-Based Language Models.
        Type: main
  BibRelationships:
    HasContributorRelationships:
      – PersonEntity:
          Name:
            NameFull: del-Hoyo-Gabaldon, Jesus-Angel
      – PersonEntity:
          Name:
            NameFull: Garcia-Cabot, Antonio
      – PersonEntity:
          Name:
            NameFull: Garcia-Lopez, Eva
      – PersonEntity:
          Name:
            NameFull: de-Fitero-Dominguez, David
    IsPartOfRelationships:
      – BibEntity:
          Dates:
            – D: 15
              M: 07
              Text: Jul2026
              Type: published
              Y: 2026
          Identifiers:
            – Type: issn-print
              Value: 20763417
          Numbering:
            – Type: volume
              Value: 16
            – Type: issue
              Value: 14
          Titles:
            – TitleFull: Applied Sciences (2076-3417)
              Type: main
ResultId 1