APA (7th ed.) Citation

Tsai, P., Wang, S., Lin, C., & Yeh, T. (2007). Test Data Compression for Minimum Test Application Time. Journal of Information Science & Engineering, 23(6), 1901.

Chicago Style (17th ed.) Citation

Tsai, Po-Chang, Sying-Jyan Wang, Ching-Hung Lin, and Tung-Hua Yeh. "Test Data Compression for Minimum Test Application Time." Journal of Information Science & Engineering 23, no. 6 (2007): 1901.

MLA (9th ed.) Citation

Tsai, Po-Chang, et al. "Test Data Compression for Minimum Test Application Time." Journal of Information Science & Engineering, vol. 23, no. 6, 2007, p. 1901.